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Analysis and design of soft-error hardened latches – Apr 17, 2005. Soft errors are functional failures resulting from the latching of single-event transients (transient voltage fluctuations at a logic node or SETs).
Soft error rate (SER) of various radiation hardened latches is analyzed by. latch is the most favorable radiation hardened latch design with limited delay, area.
This paper develops an analytical model for hardened latch and flip-flop design space exploration.  D. Li, D. Rennie, P. Chuang, D. Nairn, and M. Sachdev, "Design and analysis of metastable-hardened and soft-error tolerant high-performance, low-power flip-flops," in Proceedings.
between hardware and software (i.e., hard and/or soft CPU) and — at the very.
Soft errors are functional failures resulting from the latching of single-event transients (transient voltage fluctuations at a logic node or SETs) caused by high-energy particle strikes or electrical noise. Due to technology scaling and reduced.
A Low-Cost Reliability vs. Cost Trade-Off Methodology. – Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration.
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Redundant feedback loop is another soft error hardening method used in basic latch. According to analyses in , soft error of the internal In comparison with the TMR-Latch as a representative for SER-hardened designs, proposed circuit has less power consumption and lower timing overhead.
These new hardening latches are shown to have superior performance in terms of power-delay product as well as highest tolerance to soft errors This paper presents a comprehensive treatment (model, analysis, and design) for hardening storage elements (memories and latches) against a.
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With the decrease of the device size, soft error induced by various particles becomes a serious problem for advanced CMOS technologies. In this paper, we review the.
Significance Of Error In Numerical Methods Therefore, the data were firstly subjected to normalization and then analyzed according to the IDW and Ordinary Kriging. Feb 4, 2013. a). log(x+1)=logx+log(1+1x). Use the Taylor series approximation for logy for small values of y: log(x+1)−logx=1x−12×2+13×3+… b) Again, use. We cannot exactly compute the errors associated with numerical methods. The question is “how much error is present in our calculation and is it tolerable?. Significant digits of a number are those that can be used with confidence, e.g., the. Please try to quantify errors using approximate values only. E 2.71828182845904523536.
You develop the cloud server data gathering and analysis system. Finally. It is all about how hard it is to design and build hardware that works. The cost of.
Logic soft errors affect sequential elements (latches and flip-flops) and combinational logic.  P. Hazucha, et al., "Measurements and Analysis of SER-Tolerant Latch in a 90nm Dual Vt CMOS  T. Calin, M. Nicolaidis, and R. Velaco, "Upset Hardened Memory Design for Submicron CMOS.
Design of Robust CMOS Circuits for Soft Error Tolerance – CiteSeerX – analyze the effect of various circuit parameters on soft error. Also, we plan to design a robust latch that. Index Terms- Soft Errors, SET, SEU Hardened Latch.
This paper presents a low-power soft-error hardened pulsed latch suitable for. Keywords: Alpha Particles, Atmospheric Neutrons, Design for Reliability, Design for Soft Error. S. Borkar, Measurements and analysis of SER-tolerant latch in a.
Soft-Error Hardening Designs of Nanoscale CMOS Latches. Design methodology for IC manufacturability based on regular logic-bricks. explorative to industrial practice, the operation of nanoscale circuits has been extensively analyzed.
Oct 27, 2016. This paper presents a soft error hardened latch with high critical charge with short delay time. At 45 nm technology, the critical charge of the.